Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis
Publication information:
Wit, X. M.; Paine, A. W.; Martin, C.; Goldfain, A. M.; Garmann, R. F.; Manoharan, V. N.
Precise Characterization of Nanometer-Scale Systems Using Interferometric Scattering Microscopy and Bayesian Analysis. Applied Optics 2023, 62 (27), 7205-7215.